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    Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

    Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions by Dmitry V. Efanov, Tatiana S. Pogodina, Nazirjan M. Aripov, Sunnatillo T. Boltayev, Asadulla R. Azizov, Elnara K. Ametova, Feruza F. Shakirova

    Published 2025-01-01
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