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    Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors

    Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors by Snežana Djorić-Veljković, Emilija Živanović, Vojkan Davidović, Sandra Veljković, Nikola Mitrović, Goran Ristić, Albena Paskaleva, Dencho Spassov, Danijel Danković

    Published 2024-12-01
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