COMPENSATION OF MEASUREMENT ERRORS WHEN REDUCING LINEAR DIMENSIONS OF THE KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin

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THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME by A. K. Tyavlovsky, A. L. Zharin

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METHODS FOR LOCAL CHANGES IN THE PLASTIC DEFORMATION DIAGNOSTICS ON THE WORK FUNCTION by K. V. Panteleyev, A. I. Svistun, A. L. Zharin

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DESIGN OF THE CONTACT POTENTIALS DIFFERENCE PROBES by K. U. Pantsialeyeu, U. A. Mikitsevich, A. L. Zharin

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METHODS FOR WORK FUNCTION MEASUREMENTS FOR THE TEST OF A SURFACE IN A DURING FRICTION by K. V. Panteleyev, A. I. Svistun, A. L. Zharin

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STUDY OF STATIC ELECTRICITY CHARGE ACCUMULATION ON SURFACE OF FLUOROPOLYMER-4 PRODUCTS USING VIBRATING CAPACITOR METHOD by H. А. Vershina, A. L. Zharin, A. K. Tiavlovsky

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METROLOGICAL PERFORMANCE MODELING OF PROBE ELECTROMETERS CAPACITIVE SENSORS by A. K. Tyavlovsky, O. K. Gusev, A. L. Zharin

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Universal Digital Probe Electrometer for Testing Semiconductor Wafers by A. L. Zharin, U. A. Mikitsevich, A. I. Svistun, K. U. Pantsialeyeu

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CONTROL OF METAL SURFACES MACHINED IN ACCORDANCE WITH THE DIAMOND NANOMACHINING TECHNOLOGY BASED ON THE ELECTRON WORK FUNCTION by G. V. Sharonov, A. L. Zharin, N. I. Muhurov, K. U. Pantsialeyeu

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DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE by K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, A. L. Zharin

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Detection of Hidden Defects Induced by Thermomechanical Processing of Aluminum Substrates for Sensor Devices Using a Scanning Kelvin Probe by A. L Zharin, I. V. Gasenkova, A. K. Tyavlovsky, N. I. Mukhurov, S. I. Spitski

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Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response by U. A. Mikitsevich, A. I. Svistun, A. V. Samarina, K. U. Pantsialeyeu, A. L. Zharin

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Charge-Sensitive Technique for Deformation Processes’ Study by K. U. Pantsialeyeu, U. A. Mikitsevich, A. I. Svistun, R. I. Vorobey, O. K. Gusev, A. L. Zharin

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KELVIN PROBE SELF-CALIBRATION MODE FOR SEMICONDUCTOR WAFERS PROPERTIES MONITORING by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky

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ANALYSIS OF THE ELECTROPHYSICAL AND PHOTOELECTRIC PROPERTIES OF NANOCOMPOSITE POLYMERS BY THE MODIFIED KELVIN PROBE by K. U. Pantsialeyeu, A. U. Krautsevich, I. A. Rovba, V. I. Lysenko, R. I. Vorobey, O. K. Gusev, A. L. Zharin

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ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE by A. K. Tyavlovsky, A. L. Zharin, O. K. Gusev, R. I. Varabei, N. I. Muhurov, G. V. Sharonov, K. U. Pantsialeyeu

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KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION by S. Danyluk, A. V. Dubanevich, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, R. I. Vorobey, A. L. Zharin

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THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA by R. I. Vorobey, O. K. Gusev, A. L. Zharin, Yu. G. Kuzminsky, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, S. V. Shilko

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STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

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STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL by R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky

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