Showing 1 - 3 results of 3 for search 'A. I. Belous', query time: 0.01s Refine Results
  1. 1
    IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS

    IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS by A. I. Belous, A. V. Prybylski

    Published 2019-06-01
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  2. 2
    EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION

    EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION by A. I. Belous, A. V. Prybylski

    Published 2019-06-01
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  3. 3
    DEPTH MEASUREMENT OF DISRUPTED LAYER ON SILICON WAFER SURFACE USING AUGER SPECTROSCOPY METHOD

    DEPTH MEASUREMENT OF DISRUPTED LAYER ON SILICON WAFER SURFACE USING AUGER SPECTROSCOPY METHOD by V. A. Solodukha, A. I. Belous, G. G. Chyhir

    Published 2016-08-01
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